| 发光强度测量与计算在探针测试中的应用 |
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| 引用本文： | 田洪涛,李斌,宋婉贞. 发光强度测量与计算在探针测试中的应用[J]. 电子工业专用设备, 2013, 0(5): 30-34 |
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| 作者姓名： | 田洪涛 李斌 宋婉贞 |
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| 作者单位： | 中国电子科技集团公司第四十五研究所,北京101601 |
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| 摘 要： | 通过对光谱仪的控制,对各项发光强度参数的计算与校准,在传统的探针设备基础上增加发光强度的测试过程,从而丰富探针设备的功能。目前设备已经达到红、黄、蓝光芯片的测试的要求,并在客户现场投入使用。主要总结归纳发光强度测量计算方法与实验结论。
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| 关 键 词： | 光谱仪 发光强度参数 计算与校准 |
Light Intensity Measurement And Calculation During The Probe Test |
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| TIAN Hongtao,LI Bin,SONG Wanzhen. Light Intensity Measurement And Calculation During The Probe Test[J]. Equipment for Electronic Products Marufacturing, 2013, 0(5): 30-34 |
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| Authors: | TIAN Hongtao LI Bin SONG Wanzhen |
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| Affiliation: | (The 45th Research Institute of CETC,Beijing 101601,China) |
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| Abstract: | Based on the light intensity of the color spectrum,parameter calculation and calibration,in the tradition of the probe device is added on the basis of color test process,thus enriching the probe device function.At present,the device has reached a red,yellow,blue chip testing requirements,and put into use at customer site.This paper mainly summarized the intensity measurement and calculation methods,and experimental results. |
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| Keywords: | Spectrum Parameter of light intensity Calculation and calibration |
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