| X射线荧光光谱法测定磷矿中Na元素的重叠校正 |
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| 引用本文： | 叶罕章,冯晓军,张江坤,王涛. X射线荧光光谱法测定磷矿中Na元素的重叠校正[J]. 广东化工, 2009, 36(12): 159-160 |
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| 作者姓名： | 叶罕章 冯晓军 张江坤 王涛 |
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| 作者单位： | 云天化云南磷化集团研发中心,云南,昆明,650113 |
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| 摘 要： | 根据钠的X射线荧光光谱扫描图中干扰线ZrLα1，2（2θ=24.60°，2次线），ZnLα1，2（2θ=24．83°，1次线），ZnLβ1（2θ=24°17°，1次线），对NaKα1,2的干扰谱信息，采用数学方法和重叠校正后的系数计算分析元素的强度，此法可降低或消除露叠干扰，提高测量的准确度。
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| 关 键 词： | Na元素 X射线荧光光谱 重叠校正 |
Determination of Overlap Correction of Natrium Element in Phosphorus Ore by X-ray Fluorescence Spectrometry |
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| Ye Hanzhang,Feng Xiaojun,Zhang Jiangkun,Wang Tao. Determination of Overlap Correction of Natrium Element in Phosphorus Ore by X-ray Fluorescence Spectrometry[J]. Guangdong Chemical Industry, 2009, 36(12): 159-160 |
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| Authors: | Ye Hanzhang Feng Xiaojun Zhang Jiangkun Wang Tao |
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| Affiliation: | Ye Hanzhang,Feng Xiaojun,Zhang Jiangkun,Wang Tao(Research and Development Centre,YunTianHua,Yunnan Phosphate,Kunming 650113,China) |
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| Abstract: | The interference lines of natrium element, ZrLα1,2 （2 θ=24.60° , secondary line）, ZnLα1,2 （2 θ=24.83° , first line）, ZrLα1,2 （2 θ=24.17° , first line）, which are in the scanned picture of X-ray fluorescence spectrometer, According to the spectral interference pattern that the interference lines impose on the NaKα1, 2, to calculate the intensity of the element by adopting the mathematical method with the coefficient after overlap and correction. The method could reduce or even eliminate the superimposed interference and enhance the accuracy grade of measure. |
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| Keywords: | natrium element X-ray fluorescence spectrometry overlap correction |
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