| 结构缺陷对电子设备屏蔽效果影响分析 |
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| 引用本文： | 富震. 结构缺陷对电子设备屏蔽效果影响分析[J]. 现代电子技术, 2014, 0(18): 149-151 |
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| 作者姓名： | 富震 |
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| 作者单位： | 沈阳炮兵学院 |
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| 摘 要： | 在电子设备的屏蔽箱上开有各种用途的小孔或缝隙,外界的电磁干扰通过孔、缝进入到电子设备的内部,对内部电路造成干扰。从电磁干扰的传播途径出发,对在不同情况下结构缺陷对屏蔽效果的影响进行了分析,并提出了相应的改进措施,对电子设备的工程设计具有一定的指导意义。
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| 关 键 词： | 电磁兼容 屏蔽效能 结构缺陷 屏蔽箱 |
Analysis on influence of structural defects on electronic equipment shielding effect |
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| FU Zhen. Analysis on influence of structural defects on electronic equipment shielding effect[J]. Modern Electronic Technique, 2014, 0(18): 149-151 |
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| Authors: | FU Zhen |
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| Affiliation: | FU Zhen;Shenyang Artillery Academy; |
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| Abstract: | There are some holes or gaps in the shielding box of electronic equipment. The outside electromagnetic inter- ference will disturb the circuits inside the box through the holes or gaps. According to the transmission route of electromagnet- ic interference, the impact of structural defeets on shielding effect under different conditions is analyzed. Some improvement measures are proposed. The analysis has a certain guiding significance for the engineering design of electronic equipments. |
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| Keywords: | electromagnetic compatibilityl shielding effectiveness structural defect shielding box |
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