An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices: Charvaka Duvvury,Dave Baglee,Michael Duane,Adin Hyslop,Michael Smayling and Mike Maekawa Solid St. Electron. 27 (1), 89 (1984)期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices: Charvaka Duvvury,Dave Baglee,Michael Duane,Adin Hyslop,Michael Smayling and Mike Maekawa Solid St. Electron. 27 (1), 89 (1984)

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