| Microstructure and electrical properties of La2O3-doped ZnO-based varistor thin films by sol-gel process简 |
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| 作者姓名： | XU Dong JIANG Bin CUI Feng-dan YANG Yong-tao XU Hong-xing SONG Qi YU Ren-hong |
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| 基金项目： | Project（20123227120021） supported by the Specialized Research Fund for the Doctoral Program of Higher Education of China; Project（BK2012156） supported by the Natural Science Foundation of Jiangsu Province, China; Project（KFJJ201105） supported by the Opening Project of State Key Laboratory of Electronic Thin Films and Integrated Devices, China; Project（C J20125001） supported by the Application Program for Basic Research of Changzhou, China; Project（13KJB430006） supported by the Universities Natural Science Research project of Jiangsu Province, China; Project supported by the Industrial Center of Jiangsu University Undergraduate Practice-Innovation Training Program, China |
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| 摘 要： | Microstructure and electrical properties of La2O3-doped ZnO-Bi2O3 thin films prepared by sol-gel process have been investigated. X-ray diffraction shows that most diffraction peaks of ZnO are equal, and the crystals of ZnO grow well. Scanning electron microscopy and atomic force microscopy results indicate that the samples have a good structure and lower surface roughness. The nonlinear V-I characteristics of the films show that La2O3 develops the electrical properties largely and the best doped content is 0.3% lanthanum ion, with the leakage current of 0.25 mA, the threshold field of 150 V/mm and the nonlinear coefficient of 4.0 in detail.
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| 关 键 词： | 电阻薄膜 微观结构 电性能 ZnO 镧掺杂 凝胶法 溶胶 扫描电子显微镜 |
Microstructure and electrical properties of La2O3-doped ZnO-based varistor thin films by sol-gel process |
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| XU Dong,JIANG Bin,CUI Feng-dan,YANG Yong-tao,XU Hong-xing,SONG Qi,YU Ren-hong.Microstructure and electrical properties of La2O3-doped ZnO-based varistor thin films by sol-gel process[J].Journal of Central South University of Technology,2014(1):9-13. |
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| Abstract: | zinc oxide varistor film sol-gel process electrical properties microstructure |
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| Keywords: | zinc oxide varistor film sol-gel process electrical properties microstructure |
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