Elaboration and characterization of Fe1-xO thin films sputter deposited from magnetite target |
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Authors: | B. Mauvernay S. Capdeville E. De Grave Ph. Tailhades |
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Affiliation: | a CIRIMAT UMR CNRS 5085, Université Paul Sabatier, 118 Route de Narbonne, 31062 Toulouse Cedex 9, France b NUMAT, Department of Subatomic and Radiation Physics, University of Ghent, Proeftuinstraat 86, B-9000 Gent, Belgium |
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Abstract: | Majority of the authors report elaboration of iron oxide thin films by reactive magnetron sputtering from an iron target with Ar-O2 gas mixture. Instead of using the reactive sputtering of a metallic target we report here the preparation of Fe1-xO thin films, directly sputtered from a magnetite target in a pure argon gas flow with a bias power applied. This oxide is generally obtained at very low partial oxygen pressure and high temperature. We showed that bias sputtering which can be controlled very easily can lead to reducing conditions during deposition of oxide thin film on simple glass substrates. The proportion of wustite was directly adjusted by modifying the power of the substrate polarization. Atomic force microscopy was used to observe these nanostructured layers. Mössbauer measurements and electrical properties versus bias polarization and annealing temperature are also reported. |
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Keywords: | Iron oxide Sputtering Electrical properties and measurements Mö ssbauer spectroscopy |
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