X-ray scattering studies of molecular linkages in Zeolite microcrystal monolayers |
| |
Authors: | Heeju Lee Kyung Byung Yoon Do Hyung Kim Hyun Chul Kang Hyunjung Kim |
| |
Affiliation: | a Department of Physics, Sogang University, Seoul 121-742, South Korea b Department of Chemistry, Sogang University, Seoul 121-742, South Korea c Interdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul 121-742, South Korea d Department of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 500-712, South Korea |
| |
Abstract: | We have measured X-ray reflectivity curves of silicalite-1 microcrystal (MC) monolayers on Si wafers using two different types of molecular linkages, namely, through chloropropyl (CP) groups and through CP/polyethylene imine/CP groups. While the scanning electron microscope images of the two MC monolayers are indistinguishable of molecular linkage between the monolayers and the substrate, their reflectivity curves are distinctively different, despite the fact that the thicknesses of the molecular linkage layers (∼ 10-20 Å) are negligibly small compared to the thicknesses of MC monolayers, (∼ 3200 Å). We demonstrated that X-ray reflectivity is a very useful tool for the characterization of very thin layers of molecular linkages existing between much thicker MC monolayers and the substrate. |
| |
Keywords: | X-ray reflectivity Molecular linkages Monolayer Zeolite |
本文献已被 ScienceDirect 等数据库收录! |
|