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Nanostructured CeO2 thin films: A SAXS study of the interface between grains and pores |
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| Authors: | M. Lu?i? Lav?evi? A. Turkovi? S. Bernstorff |
| Affiliation: | a Department of Physics, Faculty of Chemical Technology, University of Split, Teslina 10, 21000 Split, Croatia b Institute “Ru?er Boškovi?”, P.O.Box 180, 10000 Zagreb, Croatia c Sincrotrone Trieste, 34012 Basovizza (TS), Italy |
| Abstract: | The analysis of the interface between grains and pores in thin films of CeO2, prepared by two different sol-gel procedures, was performed using grazing incidence small-angle X-ray scattering. The existence and the average thickness of an interfacial layer, formed during one of the preparation procedures, were examined by analyzing the depletion of scattering intensity in the Porod's scattering region. |
| Keywords: | Cerium dioxide Thin film Small-angle X-ray scattering Interface |
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