Wakefields studies for the SXFEL user facility |
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| Authors: | Ming-Hao Song Chao Feng Da-Zhang Huang Hai-Xiao Deng Bo Liu Dong Wang |
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| Affiliation: | 1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangjiang Campus, Shanghai 201204, China;University of Chinese Academy of Sciences, Beijing 100049,China;2. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangjiang Campus, Shanghai 201204, China |
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| Abstract: | Besides the original seeded undulator line,in the soft X-ray free-electron laser (SXFEL) user facility in Shanghai,a second undulator line based on self-amplified spontaneous emission is proposed to achieve 2-nm laser pulse with extremely high brightness.In this paper,the beam energy deviation induced by the undulator wakefields is numerically calculated,and 3D and 2D results agree well with each other.The beam energy loss along the undulator degrades the expected FEL output performances,i.e.,the pulse energy,radiation power and spectrum,which can be compensated with a proper taper in the undulator.Using the planned time-resolved diagnostic,a novel experiment is proposed to measure the SXFEL longitudinal wakefields. |
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| Keywords: | SXFEL Wakefields Pulse energy Radiation power Spectrum Taper |
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