Investigation of dynamic polarization stability of 850-nmGaAs-based vertical-cavity surface-emitting lasers grown on (311)B and(100) substrates |
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| Authors: | Uenohara H. Tateno K. Kagawa T. Ohiso Y. Tsuda H. Kurokawa T. Amano C. |
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| Affiliation: | NTT Opto-Electron. Labs., Kanagawa; |
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| Abstract: | The polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers (VCSELs) under dynamic operation was investigated by comparing the characteristics of VCSELs grown on (311)B and (100) GaAs substrates. Significantly larger suppression ratios of the two orthogonal polarization modes was obtained for VCSELs on (311)B substrates than those on (100) substrates under zero-bias modulation. Time-dependent orthogonal polarization suppression ratio measurements also showed that the polarization direction was more stable in the VCSEL on (311)B substrates than that on (100) substrates. Error-free transmission was realized from VCSELs on (311)B substrates with and without a polarizer in both back-to-back and 100-m multimode fiber transmission |
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