|
|||||
|
|
noise in GaAs MESFETS |
|
| Authors: | C.H. Suh A. van der Ziel R.P. Jindal |
| Affiliation: | Electrical Engineering Department, University of Minnesota, Minneapolis, MN 55455, U.S.A. |
| Abstract: | An attempt was made to discriminate between number fluctuation and mobility fluctuation noise in GaAs MESFETs. It was found, that both models could explain the data, even though the mobility fluctuation model seems more likely. |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |