| TEM小室在电磁兼容检测中的应用 |
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| 引用本文： | 熊炜. TEM小室在电磁兼容检测中的应用[J]. 上海计量测试, 2008, 35(5): 12-14 |
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| 作者姓名： | 熊炜 |
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| 作者单位： | 上海市计量测试技术研究院 |
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| 摘 要： | 随着电磁兼容检测技术的发展和提高，人们正针对不同的电子电器产品寻求更为简单的检测方法。该文介绍采用TEM小室进行辐射骚扰测试和辐射抗扰度测试的方法，使小尺寸的电子电器产品的电磁兼容测试更加便捷。
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| 关 键 词： | 电磁兼容 电波暗室 横电磁波传输小室 |
EMC test method with TEM cell |
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| Xion Wei. EMC test method with TEM cell[J]. Shanghai Meassurement and Testing, 2008, 35(5): 12-14 |
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| Authors: | Xion Wei |
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| Affiliation: | Xion Wei (Shanghai Institute of Measurement and Testing Technology) |
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| Abstract: | Along with electromagnetic compatibility technology development, people are secuching new testing method for electric and electwnie products. The article presents a way to test the emission and immunity with the TEM cell. It is simpler and more convenient for small sige products. |
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| Keywords: | EMC（Electromagnetic Compellability） anechoic chamber transverse electromagnetic transmission cell |
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