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降低有损耦合微带线间串扰的方法分析
引用本文:黎淑兰,刘元安,唐碧华. 降低有损耦合微带线间串扰的方法分析[J]. 电波科学学报, 2006, 21(4): 503-507
作者姓名:黎淑兰  刘元安  唐碧华
作者单位:北京邮电大学,电子工程学院,北京,100876;北京邮电大学,电子工程学院,北京,100876;北京邮电大学,电子工程学院,北京,100876
摘    要:为降低和控制有损耦合微带线间的串扰,在强信号线两边各插入了一列用金属填充的、顶端用微带连接的接地孔.利用FDTD方法对该结构进行模拟并利用FEM法进行了验证.模拟结果表明串扰衰减程度与基底介质的损耗、接地孔参数有关.

关 键 词:有损耦合微带线  串扰  FDTD
文章编号:1005-0388(2006)04-0503-05
收稿时间:2005-02-23
修稿时间:2005-02-23

Analysis of approach for reducing crosstalk between lossy coupled microstrip lines
LI Shu-lan,LIU Yuan-an,TANG Bi-hua. Analysis of approach for reducing crosstalk between lossy coupled microstrip lines[J]. Chinese Journal of Radio Science, 2006, 21(4): 503-507
Authors:LI Shu-lan  LIU Yuan-an  TANG Bi-hua
Affiliation:School of Electronic Engineering Beijing University of Posts and Telecommunications, Beijing 100876, China
Abstract:To reduce and control the crosstalk between lossy coupled microstrip lines, two columns of metal filled via holes which were connected by microstrips on the top of via holes and grounded were inserted in two sides of strong signal line. The finite-difference time-domain (FDTD) method is employed to simulate the structure and finite element method (FEM) for verification. The results show that the effectiveness of crosstalk reduction depends on the dielectric losses of substrate and parameters of via holes.
Keywords:FDTD
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