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Spectroscopic Ellipsometric Evaluation of Gold Nanoparticle Thin Films Fabricated Using Layer‐by‐Layer Self‐Assembly |
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| Authors: | H.‐L. Zhang S.D. Evans J.R. Henderson |
| Abstract: | |
| Keywords: | Ellipsometry Layer‐by‐layer assembly Nanoparticles, metal Structure‐property relationships Thin films |