| 一种基于存储器故障原语的March测试算法研究 |
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| 引用本文： | 石磊,王小力.一种基于存储器故障原语的March测试算法研究[J].微电子学,2009,39(2). |
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| 作者姓名： | 石磊 王小力 |
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| 作者单位： | 1. 西安交通大学,电子与信息工程学院,西安,710049
2. 西安交通大学,电子与信息工程学院,西安,710049;西安交通大学,理学院,西安,710049 |
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| 基金项目： | 教育部科学技术研究重点项目 |
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| 摘 要： | 研究高效率的系统故障测试算法,建立有效的嵌入式存储器测试方法,对提高芯片良品率、降低芯片生产成本,具有十分重要的意义.从存储器基本故障原语测试出发,在研究MarchLR算法的基础上,提出March LSC新算法.该算法可测试现实的连接性故障,对目前存储器的单一单元故障及耦合故障覆盖率提升到100%.采用March LSC算法,实现了内建自测试电路(MBIST).仿真实验表明,March LSC算法能很好地测试出嵌入式存储器故障,满足技术要求.研究结果具有重要的应用参考价值.
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| 关 键 词： | March算法 存储器 内建自测试电路 故障测试 故障原语 |
Improvement of March Algorithm Based on Memory Fault Primitive |
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| SHI Lei,WANG Xiaoli.Improvement of March Algorithm Based on Memory Fault Primitive[J].Microelectronics,2009,39(2). |
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| Authors: | SHI Lei WANG Xiaoli |
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| Affiliation: | 1.School of Electronic and Information Engineering;Xi'an Jiaotong University;Xi'an 710049;P.R.China;2.School of Sciences;P.R.China |
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| Abstract: | An effective test algorithm and test method for e-memories is significant to yield improvement and product cost-saving.A new algorithm,March LSC,based on March LR and memory fault primitive,was proposed.March LSC is capable of testing real linked-faults,and the fault coverage of single-cell faults and coupling faults was improved to 100%.MBIST(memory built in self test) circuits were implemented by using March LR and March LSC algorithms,and simulation was made for fault coverage.It has been demonstrated th... |
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| Keywords: | March algorithm Memory BIST Fault detection Fault primitive |
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