首页 | 本学科首页   官方微博 | 高级检索  
     


One-sided Post-processing for the Discontinuous Galerkin Method Using ENO Type Stencil Choosing and the Local Edge Detection Method
Authors:Rick Archibald  Anne Gelb  Sigal Gottlieb  Jennifer Ryan
Affiliation:(1) Computer Science and Mathematics Division, Oak Ridge National Lab, Oak Ridge, TN, USA;(2) Department of Mathematics, Arizona State University, Tempe, AZ 85287, USA;(3) Department of Mathematics, University of Massachusetts-Dartmouth, Dartmouth, MA 02747, USA;(4) Department of Mathematics, Virginia Tech, 460 McBryde, Blacksburg, VA 24061-123, USA
Abstract:In a previous paper by Ryan and Shu Ryan, J. K., and Shu, C.-W. (2003). \hboxMethods Appl. Anal. 10(2), 295–307], a one-sided post-processing technique for the discontinuous Galerkin method was introduced for reconstructing solutions near computational boundaries and discontinuities in the boundaries, as well as for changes in mesh size. This technique requires prior knowledge of the discontinuity location in order to determine whether to use centered, partially one-sided, or one-sided post-processing. We now present two alternative stencil choosing schemes to automate the choice of post-processing stencil. The first is an ENO type stencil choosing procedure, which is designed to choose centered post-processing in smooth regions and one-sided or partially one-sided post-processing near a discontinuity, and the second method is based on the edge detection method designed by Archibald, Gelb, and Yoon Archibald, R., Gelb, A., and Yoon, J. (2005). SIAM J. Numeric. Anal. 43, 259–279; Archibald, R., Gelb, A., and Yoon, J. (2006). Appl. Numeric. Math. (submitted)]. We compare these stencil choosing techniques and analyze their respective strengths and weaknesses. Finally, the automated stencil choices are applied in conjunction with the appropriate post-processing procedures and it is determine that the resulting numerical solutions are of the correct order.
Keywords:Accuracy enhancement  post-processing  discontinuous Galerkin method  ENO  local edge detection
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号