Structural–Property Relations in a Reduced and Internally Biased Oxide Wafer (RAINBOW) Actuator Material |
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Authors: | Catherine Elissalde,L. Eric Cross, ,Clive A. Randall |
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Affiliation: | Materials Research Laboratory, The Pennsylvania State University, University Park, Pennsylvania 16802 |
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Abstract: | Reduced and internally biased oxide wafer (RAINBOW) actuators are fabricated by a controlled reduction of Pb(Zr, Ti)O3-based piezoelectric material. The reduction process results in a conductive layer composed of an interconnected metallic lead phase and refractory oxides (ZrTiO4, ZrO2, La2O3, etc.). The nature of the reduction is discovered to be the result of a complex volume change leading to a nanoscale interconnected metallic structure. The distribution of phases within the cermet vary within the thickness of the wafer. Within the piezoelectric ceramic phase, the reduction process modifies the grain-boundary structure to give two distinct types of fracture: transgranular and intergranular. The complexed microstructures of the RAINBOW actuator materials are discussed in relation to their dielectric and piezoelectric properties. |
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