Goodness of Fit Tests for the Gamma and Exponential Distributions |
| |
| Authors: | Ram C Dahiya John Gurland |
| |
| Affiliation: | 1. University of Massachusetts , Amherst , Massachusetts;2. University of Wisconsin , Madison , Wisconsin |
| |
| Abstract: | Goodness of fit tests based on generalized minimum x 2 techniques are developed for the gamma and exponential distributions. The power of these tests has been found for several alternative families of distributions by utilizing the asymptotic non-null distribution of the test statistic. The tests behave very well for the types of alternatives considered here. Applications to some failure data of Proschan (1963) are included for illustrative purposes. |
| |
| Keywords: | Tests Fit Gamma Exponential Distributions |
|
