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超薄硅片贴膜抛光技术研究
引用本文:王云彪,陈亚楠,刘玉岭,杨红星.超薄硅片贴膜抛光技术研究[J].电子工艺技术,2011,32(1):48-50.
作者姓名:王云彪  陈亚楠  刘玉岭  杨红星
作者单位:中国电子科技集团公司第四十六研究所,天津,300220
摘    要:伴随着集成电路芯片的不断轻薄化,各种高质量的超薄抛光片衬底需求日益增加.介绍了一种简捷、方便的手动贴膜方法,并将其应用在200μm厚7.6 cm硅单晶免清洗单面抛光片加工过程中,通过与粘蜡抛光相比较,发现贴膜抛光实用性更强、成品率更高且成本更低.

关 键 词:超薄抛光片  粘蜡抛光  贴膜

Research on Back Protecting Tape for Ultrathin Silicon Wafer Polishing Process
WANG Yun-biao,CHEN Ya-nan,LIU Yu-ling,YANG Hong-xing.Research on Back Protecting Tape for Ultrathin Silicon Wafer Polishing Process[J].Electronics Process Technology,2011,32(1):48-50.
Authors:WANG Yun-biao  CHEN Ya-nan  LIU Yu-ling  YANG Hong-xing
Affiliation:WANG Yun-biao,CHEN Ya-nan,LIU Yu-ling,YANG Hong-xing(The 46th Research Institute of CETC,Tianjin 300220,China)
Abstract:As IC chips become increasingly lighter,high quality of ultrathin polished wafers are demanded.Introduce a convenient method for affixing protective tape on the backside of the wafer manually,and apply it in 200 μm thickness of 7.6 cm epi-ready silicon wafer polishing process.Compare to the polishing process with wax,using tape is more practical,higher finished product ratio and lower cost.
Keywords:ultrathin polished wafers: polishing process with wax: Affix protective tape  
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