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| Study of SEU Sensitive Volume of Microelectronic Devices | |
| 摘 要： | It is important to determine the sensitive volume (Sv) thickness of micro-electronic devices, since the Sv thickness is a key parameter for estimating single event rates in space. Most of the models for proton single event upset (SEU) predictions use the … |
| 本文献已被 CNKI 等数据库收录！ | |