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具有积累层沟道的槽栅IGBT结构
引用本文:钱梦亮,李泽宏,张波,李肇基.具有积累层沟道的槽栅IGBT结构[J].半导体学报,2010,31(3):034002-4.
作者姓名:钱梦亮  李泽宏  张波  李肇基
作者单位:State;Laboratory;Electronic;Thin;Films;Integrated;Devices;University;Science;Technology;
摘    要:提出了一种具有积累层沟道的槽栅IGBT结构。仿真结果表明:在阻断电压为1200V,集电极电流密度为100 A/cm2,温度分别为300K和400K下的情况下,积累层沟道槽栅IGBT的正向压降分别为1.5V 和2V而常规槽栅IGBT分别为1.7V和2.4V。新结构比常规槽栅IGBT具有更低的开态压降和更大的正向安全工作区。文中同时分析了积累层沟道槽栅IGBT的阻断特性和关断特性。

关 键 词:绝缘栅双极晶体管  沟槽结构  积累  IGBT  通道  电极电流密度  通态压降  ACT
收稿时间:8/2/2009 9:31:45 PM

Insulated gate bipolar transistor with trench gate structure of accumulation channel
Qian Mengliang,Li Zehong,Zhang Bo and Li Zhaoji.Insulated gate bipolar transistor with trench gate structure of accumulation channel[J].Chinese Journal of Semiconductors,2010,31(3):034002-4.
Authors:Qian Mengliang  Li Zehong  Zhang Bo and Li Zhaoji
Affiliation:State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology, Chengdu 610054, China;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology, Chengdu 610054, China
Abstract:An accumulation channel trench gate insulated gate bipolar transistor (ACT-IGBT) is proposed. The simulation results show that for a blocking capability of 1200 V, the on-state voltage drops of ACT-IGBT are 1.5 and 2 V at a temperature of 300 and 400 K, respectively, at a collector current density of 100 A/cm2. In contrast, the on-state voltage drops of a conventional trench gate IGBT (CT-IGBT) are 1.7 and 2.4 V at a temperature of 300 and 400 K, respectively. Compared to the CT-IGBT, the ACT-IGBT has a lower on-state voltage drop and a larger forward bias safe operating area. Meanwhile, the forward blocking characteristics and turn-off performance of the ACT-IGBT are also analyzed.
Keywords:ACT-IGBT  CT-IGBT  on-state voltage drop  forward blocking voltage  FBSOA
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