Thermoelectric and morphological effects of peltier pulsing on directional solidification of eutectic Bi-Mn |
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Authors: | R. P. Silberstein D. J. Larson B. Dressler |
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Affiliation: | (1) Research and Development Center, Grumman Aerospace Corporation, 11714 Bethpage, NY |
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Abstract: | We have carried out extensivein situ thermal measurements during Peltier Interface Demarcation (PID) during directional solidification of eutectic Bi/MnBi. We have observed that significant thermal transients occur throughout the sample as a result of the Peltier pulsing. We have separated the contributions of the Peltier, Thomson, and Joule heats, and studied them as a function of pulse intensity and polarity. The Joule and the combined Peltier and Thomson thermal contributions were determined as a function of time during and after the current pulses, close to the solid/liquid interface. Variations of the Bi/MnBi particle morphology clearly reveal the interface shape, changes in interface velocity, meltback, and temporary loss of cooperative growth, as a result of the pulsing. This paper is based on a presentation made at the symposium “Fluid Flow at Solid-Liquid Interfaces” held at the fall meeting of the TMS-AIME in Philadelphia, PA on October 5, 1983 under the TMS-AIME Solidification Committee. |
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