一种用于器件模型参数提取的芯片测试数据的获取方法

半导体器件的建模及模型参数提取是电子设计自动化(EDA)领域的关键性工作。要提取器件参数,获取并处理复杂繁重的测量数据是前提条件,也是非常重要的一个环节,如何简单有效的提取并处理参数提取测试数据就显得格外重要。本文提出了简单易用的用于器件模型参数提取的测试数据的获取方法。实验证明,该方法可以有效的获取大量繁杂的测试数据,具有较高的精确度,而且简单易用,适合推广使用。

A Measurement Method of Chip Test Data for the Process of Device Model Parameters Extraction

Device model and model parameter extraction is the most important part of the electronic design automation（EDA）areas.To extract the device parameters,obtaining and processing of complex measurement data is very important.A simple method to obtaining the test data for device model parameter extraction is proposed in this paper.The experimental results show that the method can obtain and process complex measurement data effectively and accurately,and it is is convenient to apply it to other complex parameter extraction fields.