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Semiconducting properties of thermal scales grown on a chromia-forming alloy under controlled oxygen partial pressures
Affiliation:1. Département Science des Matériaux, Université des Sciences et de Technologie Houari Boumediene, Algeria;2. SIMaP, University of Grenoble, France;3. IJL, University of Lorraine, France;1. State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi''an 710072, PR China;2. Beijing Institute of Aeronautical Materials, Beijing 100095, PR China;1. Shenzhen Key Laboratory of Advanced Manufacturing Technology for Mold & Die, Shenzhen University, Nanhai Avenue 3688, Shenzhen 518060, Guangdong, PR China;2. Guangdong Key Laboratory of Advanced Optical and Precision Manufacturing Technology, Shenzhen University, Nanhai Avenue 3688, Shenzhen 518060, Guangdong, PR China
Abstract:The present work is focused on the oxidation at 1050 °C of a model chromia-forming alloy, paying special attention to the control of the oxygen partial pressure. Taking benefit of a recently developed approach to describe and fit photocurrent energy spectra, photoelectrochemical characterizations allowed to reveal the presence, in the scale formed at low P(O2) (10−15 atm), of an unexpected high number of oxide phases. This result underlines the complexity of the scale in term of chemical composition as well as of the semiconducting types of the individual phases.
Keywords:A. Alloy  C. High temperature corrosion
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