| 基于Pro/E及Ansys集成环境下的导电触片有限元分析 |
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| 引用本文： | 张英平,金士良,洪跃.基于Pro/E及Ansys集成环境下的导电触片有限元分析[J].机电一体化,2006,12(3):49-52. |
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| 作者姓名： | 张英平 金士良 洪跃 |
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| 作者单位： | 上海大学机电工程与自动化学院,上海,200072 |
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| 摘 要： | 针对Ansys及Pro/E软件各自的功能特点,对这两种软件的集成连接方法做了相应的对比研究,建立了基于这两种软件的集成设计分析平台,在此平台上,对集线器产品导电触片进行了有限元分析,该方法的应用缩短了集线器产品的开发周期,提高了集线器产品的设计效率.
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| 关 键 词： | 集成 导电触片 有限元分析 |
The FEA for Electronic Contact at the Integrated Platform of Pro/E and Ansys |
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| Authors: | Zhang YingPing;Jin ShiLiang;Hong Yue |
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| Abstract: | Through comparing the functions of the software of Ansys and Pro/E, the integrated methods is researched and the design platform is built based on Pro/E and Ansys, as well as the electric contact of wiring device is analyzed at the platform, which shortens the development cycle of wiring device and improves the efficiency of design. |
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| Keywords: | Pro/E Ansys |
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