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A Method for Measuring the Raman Scattering Spectra of Thin Films |
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| Authors: | E. M. Dianov E. B. Intyushin V. V. Koltashev V. G. Plotnichenko Yu. I. Chigirinskii |
| Affiliation: | (1) Research Fiber Optics Center, Prokhorov General Physics Institute, Russian Academy of Sciences, ul. Vavilova 38, Moscow, 119991, Russia;(2) Research Physicotechnical Institute, Lobachevskii State University, pr. Gagarina 23/3, Nizhni Novgorod, 603950, Russia |
| Abstract: | A simple method for measuring Raman light scattering by thin films is proposed. It allows the negative effect of the substrate material onto which various coatings are deposited to be excluded. Raman scattering spectra are presented. |
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