| 基于CCD技术的塑料薄膜缺陷检测系统 |
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| 引用本文： | 许恒迎. 基于CCD技术的塑料薄膜缺陷检测系统[J]. 绝缘材料, 2008, 41(3): 60-63 |
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| 作者姓名： | 许恒迎 |
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| 作者单位： | 聊城大学物理科学与信息工程学院 |
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| 摘 要： | 采用测量中广泛使用的光电转换器件线阵电荷耦合(CCD)技术,完成了塑料薄膜缺陷检测系统的总体方案设计。基于DSO的塑料薄膜缺陷检测系统在平行光的照射下,通过线阵CCD控制电路获得塑料薄膜缺陷信号,使用虚拟示波器DSO-2902对一维缺陷信号进行采集、传输,借助于计算机进行分析处理,精确地检测出薄膜的缺陷。
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| 关 键 词： | 光电检测 DSO 塑料薄膜 缺陷 CCD |
The CCD-based Inspecting System of Defects in Plastic Film |
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| XU Heng-ying. The CCD-based Inspecting System of Defects in Plastic Film[J]. Insulating Materials, 2008, 41(3): 60-63 |
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| Authors: | XU Heng-ying |
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| Abstract: | A whole scheme design for the detecting system of defects in plastic film was achieved,in which the photoelectric converter linear array CCD technology was adopted. The detecting system of defects in plastic film based on DSO obtains signals of defects in plastic film with irradiation of parallel light by using linear array CCD control circuit. The one-dimensional defect signals were collected and transferred by using virtual oscillograph DSO-2902,and then were analyzed and processed by using computer. Thereby,the defects were precisely figured out. |
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| Keywords: | photoelectric detection digital storage oscilloscope(DSO) plastic film defects charge coupled device(CCD) |
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