An ADC histogram test based on small-amplitude waves

This paper deals with a new method improving the static test for analogue-to-digital converters. The method is based on a histogram procedure using as test signals small-amplitude triangular waves superimposed on suitable constant offset values. The histogram is built over the converter fullscale by varying the offset step by step systematically. A small amplitude and a reduced time slope in comparison to the converter range and slew rate, respectively, lead to static test conditions. This procedure allows inexpensive function generators to be used and the test duration to be dramatically reduced. Experimental results of tests aimed at validating, characterizing, and comparing the proposed method on two different converter architectures are presented.