首页 | 本学科首页   官方微博 | 高级检索  
     

Thermo—analysis of Preparation Process for Electron Trapping Materials
引用本文:HUANGLi-qing WANGYong-chang ZHAOjun-wu. Thermo—analysis of Preparation Process for Electron Trapping Materials[J]. 半导体光子学与技术, 2003, 9(2): 112-115
作者姓名:HUANGLi-qing WANGYong-chang ZHAOjun-wu
作者单位:SchoolofScience,XI‘anJiaotongUniversity,Xi’an710049,CHN
基金项目:国家自然科学基金,西安交通大学校科研和教改项目 
摘    要:The heated process of raw materials for electron trapping maerials(EMT) is investigated by thermo-analysis method.The temperature range of raw materials experienced some physical and chemical change processes,such as dehydration,organic solvent removal,crystal sulphur burning,oxidation of alkaline earth sulfides and solid phase reaction(rare earth doped)and so on,are obtained.The experimental results also show thaat the presence of oxygen in shielded gas is very harmful to prepare the ETM.The raw material thermo-analysis results provide very important experimental reference for optimizing the ETM preparation techniques.

关 键 词:示差热分析 热重量 电子俘获材料 ETM
收稿时间:2002-07-10

Thermo-analysis of Preparation Process for Electron Trapping Materials
HUANG LI-qing,WANG Yong-chang,ZHAO Jun-wu. Thermo-analysis of Preparation Process for Electron Trapping Materials[J]. Semiconductor Photonics and Technology, 2003, 9(2): 112-115
Authors:HUANG LI-qing  WANG Yong-chang  ZHAO Jun-wu
Abstract:The heated process of raw materials for electron trapping materials (ETM) is investigated by thermo-analysis method. The temperature ranges of raw materials experienced some physical and chemical change processes, such as dehydration, organic solvent removal, crystal sulphur burning, oxidation of alkaline earth sulfides and solid phase reaction (rare earth doped) and so on, are obtained. The experimental results also show that the presence of trace oxygen in shielded gas is very harmful to prepare the ETM.The raw material thermo-analysis results provide very important experimental reference for optimizing the ETM preparation techniques.
Keywords:Differential thermal analysis  Thermo-gravimetric analysis  Electron trapping materials
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号