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基于ARM和FPGA的CCD低噪声测量系统的设计
引用本文:陶纯匡,尹刚,汪涛,张世敉,王二刚.基于ARM和FPGA的CCD低噪声测量系统的设计[J].电子测量技术,2010,33(3):64-66,71.
作者姓名:陶纯匡  尹刚  汪涛  张世敉  王二刚
作者单位:重庆大学数理学院,重庆,400030
基金项目:重庆大学大学生科研训练计划资助项目
摘    要:传统的电荷耦合器件(CCD)测量系统,在精度和噪声控制方面都无法满足现代测量的要求。讲述了用ARM为主要控制单元,以FPGA作为时序发生器,同时使用带相关双采样的AD和异步的先进先出(FIFO)存储器来组成一种新型测量系统。并且重点介绍FPGA配合ARM怎样完成高效、灵活的实时采集和传输。并通过单缝衍射实验来验证本系统的高精度和高稳定性。

关 键 词:CCD  ARM  FPGA  单缝衍射

Low noise CCD measuring system design based on ARM and FPGA
Tao Chunkuang,Yin Gang,Wang Tao,Zhang Shijiu,Wang Ergang.Low noise CCD measuring system design based on ARM and FPGA[J].Electronic Measurement Technology,2010,33(3):64-66,71.
Authors:Tao Chunkuang  Yin Gang  Wang Tao  Zhang Shijiu  Wang Ergang
Affiliation:Chong Qing University;College of Mathematics and Physics;Chongqing 400030
Abstract:The traditional charge-coupled device(CCD) measurement systems are unable to satisfy the requirements of modern measurement in the aspect of precision and noise control.This paper describes using ARM as the main control unit,utilize FPGA as a timing generator,while the use of AD with a correlated double sampling and asynchronous FIFO(FIFO)memory to form a new measurement system.And highlight how the FPGA with ARM to complete an efficient,flexible real-time acquisition and transmission.Through the single-sli...
Keywords:CCD  ARM  FPGA  single-slit diffraction  
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