Ferroelectric relaxor behavior and dielectric spectroscopic study of 0.99(Bi0.5Na0.5TiO3)-0.01(SrNb2O6) solid solution |
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Authors: | KN Singh PK Bajpai |
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Affiliation: | Advance Material Research Laboratory, Department of Pure & Applied Physics, Guru Ghasidas Vishwavidyalaya, Bilaspur 495009, India |
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Abstract: | 0.99(Bi0.5Na0.5TiO3)-0.01(SrNb2O6) was prepared by simple solid state reaction route. Material stabilized in rhombohedral perovskite phase with lattice constants a = 3.9060 Å, α = 89.86° and ah = 5.4852 Å, ch = 6.7335 Å for hexagonal unit cells. Density of material was found 5.52 gm/cm3 (92.9% of theoretical one) in the sample sintered at 950 °C. The temperature dependent dielectric constant exhibits a broad peak at 538 K (?m = 2270) at 1 kHz that shows frequency dependent shifts toward higher temperature - typical relaxor behavior. Modified Curie-Weiss law was used to fit the dielectric data that exhibits almost complete diffuse phase transition characteristics. The dielectric relaxation obeys the Vogel-Fulcher relationship with the freezing temperature 412.4 K. Significant dielectric dispersion is observed in low frequency regime in both components of dielectric response and a small dielectric relaxation peak is observed. Cole-Cole plots indicate polydispersive nature of the dielectric relaxation; the relaxation distribution increases with increase in temperature. |
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Keywords: | X-ray diffraction Ferroelectrics Crystal structure Dielectric response |
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