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Generating test data for both path coverage and fault detection using genetic algorithms
Authors:Dunwei GONG  Yan ZHANG
Affiliation:[1]School of Information and Electrical Engineering, China University of Mining and Technology, Xuzhou, 221116, China [2]School of Technology, Mudanjiang Normal University, Mudanjiang, 157012, China
Abstract:software testing, path coverage, fault detection, test data, multi-objective optimization, genetic algorithms
Keywords:software testing   path coverage   fault detection   test data   multi-objective optimization   genetic algorithms
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