New measurement technique for waveguide losses based on photoluminescence |
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| Authors: | Amersfoort M.R. Grutzmacher D. Smit M.K. Oei Y.S. |
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| Affiliation: | Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands; |
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| Abstract: | A new technique has been developed to measure optical losses of waveguide devices fabricated in III-V semiconductors by optical excitation of an integrated twinguide structure, which is nondestructive and also applicable to multimode waveguides and multiport waveguide devices. Reproducibility of excitation was found to be better than 0.2 dB.<> |
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