| 采用部分增强型扫描提高跳变时延故障覆盖率的触发器选择方法 |
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| 引用本文： | 裴颂伟,李华伟,李晓维.采用部分增强型扫描提高跳变时延故障覆盖率的触发器选择方法[J].计算机辅助设计与图形学学报,2010,22(9). |
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| 作者姓名： | 裴颂伟 李华伟 李晓维 |
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| 作者单位： | 1. 中国科学院计算机系统结构重点实验室,北京,100190;中国科学院计算技术研究所,北京,100190;中国科学院研究生院,北京,100049
2. 中国科学院计算机系统结构重点实验室,北京,100190;中国科学院计算技术研究所,北京,100190 |
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| 基金项目： | 国家自然科学基金，国家"九七三"重点基础研究发展计划项目，北京市教育委员会共建项目专项资助 |
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| 摘 要： | 选择关键的常规扫描触发器进行置换是采用部分增强型扫描时延测试方法的核心问题.通过定义常规扫描触发器和未检测跳变时延故障的相关度的概念及其计算方法,提出一种触发器选择方法.首先找到被测电路中采用捕获加载方法不可测,但采用增强型扫描可测的跳变时延故障;然后依据常规扫描触发器与这些故障的相关度把少量关键的常规扫描触发器替换成为增强型扫描单元,从而有效地提高电路中跳变时延故障被检测的概率.实验结果表明,采用文中方法在可以接受的硬件开销下能有效地提高被测电路中的跳变时延故障覆盖率.
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| 关 键 词： | 时延测试 跳变时延故障 增强型扫描 故障覆盖率 触发器选择 |
Flip-Flop Selection for Partial Enhanced-Scan Delay Testing with High Transition Fault Coverage |
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| Pei Songwei,Li Huawei,Li Xiaowei.Flip-Flop Selection for Partial Enhanced-Scan Delay Testing with High Transition Fault Coverage[J].Journal of Computer-Aided Design & Computer Graphics,2010,22(9). |
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| Authors: | Pei Songwei Li Huawei Li Xiaowei |
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| Affiliation: | Pei Songwei1,2,3),Li Huawei1,2),and Li Xiaowei1,2)1)(Key Laboratory of Computer System and Architecture,Chinese Academy of Sciences,Beijing 100190)2)(Institute of Computing Technology,Beijing 100190)3)(Graduate School of Chinese Academy of Sciences,Beijing 100049) |
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| Abstract: | A key issue brought by partial enhanced-scan delay testing is how to select the critical normal-scan flip-flops to be replaced with enhanced-scan cells.We present a flip-flop selection method based on the defined relative measure between a normal-scan cell and the undetected transition delay faults,by which a small number of selected normal-scan cells can be replaced with enhanced-scan cells to improve the probability of detecting transition delay faults effectively.Experimental results demonstrated that th... |
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| Keywords: | delay testing transition delay fault enhanced scan fault coverage flip-flop selection |
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