首页 | 本学科首页   官方微博 | 高级检索  
     

大功率白光LED加速寿命试验研究
引用本文:赵阿玲,贺卫利,陈建新.大功率白光LED加速寿命试验研究[J].郑州轻工业学院学报(自然科学版),2010,25(1):65-68.
作者姓名:赵阿玲  贺卫利  陈建新
作者单位:北京工业大学,电子信息与控制学院,北京,100022
摘    要:对新型大功率GaN基蓝光芯片激发荧光粉发射白光的LED进行电流应力加速寿命测试和可靠性研究,考察白光LED主要性能参数随老化时间的变化,结果表明:经过5000多小时的老化,光通量平均降至初始值的77.5%;发光效率变化趋势与光通量变化基本一致;峰值波长没有明显的变化趋势,而相关色温随老化时间增加逐渐升高;正向导通电压也随老化时间增加而升高.实验表明样品参数型失效主要包括发光效率的降低和荧光粉转换效率的降低.

关 键 词:白光LED  寿命试验  失效分析

Experimental aging of high-power white LED
ZHAO A-ling,HE Wei-li,CHEN Jian-xin.Experimental aging of high-power white LED[J].Journal of Zhengzhou Institute of Light Industry(Natural Science),2010,25(1):65-68.
Authors:ZHAO A-ling  HE Wei-li  CHEN Jian-xin
Affiliation:ZHAO A-ling,HE Wei-li,CHEN Jian-xin (School of Electr.Infor., Control Eng.,Beijing Univ.of Tech.,Beijing 100022,China)
Abstract:Current stress accelerated lifetime tests on 1W GaN based white LED were performed and its reliability were studied.Some key performance parameters of white LED changing with aging time were analyzed. The results showed that after more than 5 000 h aging,the average flux decreased to 77.5%of the initial flux;the peak wavelength did not show apparent changing trend with aging time;correlated color temperature increased with aging time;and so as the voltage.According to experimental results,the main reasons o...
Keywords:white LED  life test  failure analysis  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号