基于粒子群算法的故障测试集优化

为加速测试进程和减少测试开销，数字集成电路在生成测试矢量后必须进行故障测试集的优化。文中利用粒子群优化算法生成最小完备测试集，根据故障测试集优化问题的具体特点，构造粒子的表达方式和编码规则，建立粒子群的速度一位置模型；同时为提高优化效率，引入混沌优化算法来初始化粒子群。实验结果表明，在测试生成后，该方法能在较短的时间内生成最小完备测试集，验证了它的实用性和有效性。

Fault Test Set Optimization Based on Particle Swarm Optimization Algorithm

To accelerate test process and cut down the test spending,the fault test set must be optimized after generating test vectors for digital integrated circuits.This paper presents an algorithm to generate the minimum complete test set using particle swarm optimization(PSO).According to the actual characteristics of fault test set optimization,the particle expression and coding rule are constructed,and the speed-position model of PSO is established for fault test set optimization of digital integrated circuits....