首页 | 本学科首页   官方微博 | 高级检索  
     

污秽溶液对生物可降解聚乙烯绝缘破坏的影响
引用本文:杜伯学,刘勇,孟令飞.污秽溶液对生物可降解聚乙烯绝缘破坏的影响[J].材料工程,2009(7).
作者姓名:杜伯学  刘勇  孟令飞
作者单位:天津大学,电力系统仿真控制教育部重点实验室,天津,300072
基金项目:教育部高等学校博士学科点专项科研基金,国家自然科学基金 
摘    要:采用生物可降解聚乙烯薄膜为试样,考察了污秽程度对绝缘破坏的影响,通过单筒连续变倍视频显微镜对破坏痕取像,利用图像模式识别计算破坏面积与盒子维数,同时与高密度聚乙烯的绝缘破坏特性进行对比,结果表明:生物可降解聚乙烯的击穿电压随污秽程度的加剧而降低,但高于高密度聚乙烯的击穿电压;破坏面积与盒子维数随污秽程度的加剧而减小,但低于高密度聚乙烯的破坏面积与盒子维数.

关 键 词:生物可降解  聚乙烯薄膜  污秽程度  绝缘破坏  模式识别  盒子维数

Dielectric Breakdown Properties of Biodegradable Polyethylene Film Immersed in Contamination Solution
DU Bo-xue,LIU Yong,MENG Ling-fei.Dielectric Breakdown Properties of Biodegradable Polyethylene Film Immersed in Contamination Solution[J].Journal of Materials Engineering,2009(7).
Authors:DU Bo-xue  LIU Yong  MENG Ling-fei
Abstract:Eco-friendly insulating materials have been expected to solve severe environmental pollution caused by electric and electronic insulating castoffs. As typical friendly-environmental materials,biodegradable polymers are needed systematical investigation on their electrical properties for the substitute of present insulating materials. Biodegradable polyethylene (BDPE) films were employed as the specimens and high density polyethylene (HDPE) films were selected as the reference. Effects of contamination level on dielectric breakdown properties of BDPE film immersed in artificial saline solutions were investigated by using DC voltage. The breakdown craters were captured by using a monocular-video-zoom microscope. An image-pattern-identification technique was applied to calculate the breakdown area and box dimension of breakdown craters. Obtained results revealed that for both BDPE film and HDPE film, breakdown voltage, breakdown area and box dimension all decrease with increasing the contamination level. By comparing the test results, it showed that under contaminated conditions, breakdown endurance of BDPE film is better than that of HDPE film.
Keywords:biodegradable polyethylene film  contamination level  dielectric breakdown  pattern identification  box dimension
本文献已被 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号