| 基于线阵CCD拼接技术的一维尺寸测量 |
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| 引用本文： | 余震,文艺. 基于线阵CCD拼接技术的一维尺寸测量[J]. 传感器与微系统, 2004, 23(7): 57-59 |
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| 作者姓名： | 余震 文艺 |
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| 作者单位： | 1. 安徽建筑工业学院,数理系,安徽,合肥,230022
2. 武汉重工铸锻有限责任公司,湖北,武汉,430084 |
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| 摘 要： | 通过分析基于线阵CCD传感器的一维尺寸测量原理,提出了采用拼接技术测量较大一维尺寸的测量方案,并系统分析了该方案的测量误差。实验表明:采用该方案进行一维尺寸测量时,可以达到较大的测量范围和较高的测量准确度。
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| 关 键 词： | 线阵CCD 尺寸测量 误差分析 |
| 文章编号： | 1000-9787(2004)07-0057-03 |
| 修稿时间： | 2004-01-29 |
One dimension size measurement based on connected technology of linear array CCD |
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| YU Zhen,WEN Yi. One dimension size measurement based on connected technology of linear array CCD[J]. Transducer and Microsystem Technology, 2004, 23(7): 57-59 |
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| Authors: | YU Zhen WEN Yi |
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| Affiliation: | YU Zhen~1,WEN Yi~2 |
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| Abstract: | By analysing the measurement's principle of one dimension size based on linear array CCD sensor,a measurement's scheme used the connected technology of CCD sensors for measuring a large size has been put forward,and the measurement's error has been analysed. Through a measurement experiment,with the technology, to achieve a large measurement range and high measurement accuracy has been proved. |
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| Keywords: | linear array CCD size measurement analysis of measurement's error |
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