Semiconductor and thermoluminescent dosimetry of pulsed soft X ray plasma sources |
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Authors: | Krása J Cejnarová A Juha L Ryć L Scholz M Kubes P |
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Affiliation: | Department of Gas Lasers, Institute of Physics, ASCR, Prague, Czech Republic. krasa@fzu.cz |
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Abstract: | A multichannel detection system having a dynamic range of approximately 1 x 10(-9) Gy --20 Gy was developed with the use of commercially produced Si-photodiodes and TLDs for accurate measurement of X ray energy emitted from plasma-focus facility and from laser-produced plasmas. The proof of linearity of the employed detectors accomplished by a comparison of their responses to a broad band spectrum of X rays emitted from plasmas, is reported. It is demonstrated that TLDs irradiated with no protective filter show an incorrect response due to overloading in the sub-keV range and repopulation of dosimetric peaks induced by the UV radiation. The measurement of the power of undesirable secondary X ray sources driven by the primary plasma inside the interaction chamber was performed on the basis of analysis of space dependence of X ray intensity with respect to the assumed r(-2) decrease in the intensity far away from the plasma. |
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