首页 | 本学科首页   官方微博 | 高级检索  
     


Electron beam testing: Methods and applications
Authors:H P Feuerbaum
Abstract:There are eight e-beam methods of testing integrated circuits. The principle and performance of the various methods will be discussed in this paper. The performance criteria are voltage resolution and the frequency range in which voltage changes can be detected. From this it is possible to decide which methods are best suited for testing the various IC types available today.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号