Ellipsometry in the Study of Dynamic Material Properties |
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Authors: | A. W. Obst K. R. Alrick K. Boboridis W. T. Buttler B. R. Marshall J. R. Payton M. D. Wilke |
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Affiliation: | (1) Physics Division, MS H803, Los Alamos National Laboratory, Los Alamos, New Mexico, 87545, U.S.A;(2) Bechtel Nevada, Special Technologies Laboratory, 5520 Ekwill Street, Suite B, Santa Barbara, California, 93111, U.S.A |
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Abstract: | Measurements of the time-dependent absolute temperature of surfaces shocked using high explosives (HE) provide valuable constraints on the equations-of-state (EOS) of materials and on the state of ejecta from those surfaces. In support of these dynamic surface temperature measurements, techniques for measuring the dynamic surface emissivity of shocked metals in the near infrared (IR) are being developed. These consist of time-dependent laser ellipsometric measurements, using several approaches. A discussion of these ellipsometric techniques is included here. Ellipsometry permits an accurate determination of the dynamic emissivity at a given wavelength, and may also provide a signature of melt in shocked metals. |
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Keywords: | ellipsometry emissivity infrared pyrometry |
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