基于分数阶相关的模拟集成电路软故障诊断* Deng Yong(邓勇), Shi Yibing(师奕兵)and Zhang Wei(张伟)

针对模拟集成电路软故障诊断的难题,提出了基于分数阶相关的方法。首先,利用分数阶小波包将待测试电路(CUT)的Volterra级数进行分解,计算出分数阶相关函数。然后,用得到的分数阶相关函数构造出待测试电路的故障特征。通过对故障特征的比较,可以将待测试电路的各种软故障状态进行辨识并对故障实现定位。标准电路的仿真实验描述了这一方法并验证了该方法对模拟集成电路软故障诊断的有效性。

Diagnosis of soft faults in analog integrated circuits based on fractional correlation

Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test (CUT) decomposed by the fractional wavelet packet are used to calculate the fractional correlation functions. Then, the calculated fractional correlation functions are used to form the fault signatures of the CUT. By comparing the fault signatures, the different soft faulty conditions of the CUT are identified and the faults are located. Simulations of benchmark circuits illustrate the proposed method and validate its effectiveness in diagnosing soft faults in analog integrated circuits.