Statistical Tolerance Analysis for Assured Analog Test Coverage |
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Authors: | Sule Ozev Alex Orailoglu |
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Affiliation: | (1) ECE Department, Duke University, Durham, NC 27708, USA;(2) CSE Department, University of California, San Diego, La Jolla, CA 92093, USA |
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Abstract: | Increasing numbers of analog components in today's systems necessitate system level test composition methods that utilize on-chip capabilities rather than solely relying on costly DFT approaches. We outline a tolerance analysis methodology for test signal propagation to be utilized in hierarchical test generation for analog circuits. A detailed justification of this proposed novel tolerance analysis methodology is undertaken by comparing our results with detailed SPICE Monte-Carlo simulation data on several combinations of analog modules. The results of our experiments confirm the high accuracy and efficiency of the proposed tolerance analysis methodology. |
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Keywords: | analog test tolerance analysis test signal propagation statistical analysis |
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