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靶材刻蚀对磁控溅射镀膜厚度分布的影响
引用本文:张勇喜,金秀,胡雯雯,宋姝,张玲玲,张岳. 靶材刻蚀对磁控溅射镀膜厚度分布的影响[J]. 光学仪器, 2011, 33(1): 78-82. DOI: 10.3969/j.issn.1005-5630.2011.01.018
作者姓名:张勇喜  金秀  胡雯雯  宋姝  张玲玲  张岳
作者单位:沈阳仪表科学研究院,汇博光学技术公司,辽宁,沈阳,110043
摘    要:为考察实际磁控溅射镀膜生产过程中由于靶材不断刻蚀消耗而造成的膜厚分布变化,文中就圆形磁控溅射靶建立了沉积模型,采用泰勒级数展开方式得到了薄膜分布的三阶近似解,并采用数值积分的方法计算出不同溅射角分布和靶基距时新靶和旧靶的相对厚度分布.计算结果表明溅射角分布的变化对膜厚分布影响较小,而靶基距变化影响较大;随着靶基距增加,...

关 键 词:磁控溅射  膜厚分布  数值积分  泰勒级数
收稿时间:2010-08-13

Influence of target erosion on film distribution in magnetron sputtering process
ZHANG Yongxi,JIN Xiu,HU Wenwen,SONG Shu,ZHANG Lingling and ZHANG Yue. Influence of target erosion on film distribution in magnetron sputtering process[J]. Optical Instruments, 2011, 33(1): 78-82. DOI: 10.3969/j.issn.1005-5630.2011.01.018
Authors:ZHANG Yongxi  JIN Xiu  HU Wenwen  SONG Shu  ZHANG Lingling  ZHANG Yue
Affiliation:(HB Optical Technology Co.,Ltd.,Shenyang Academy of Instrumentation Science,Shenyang 110043,China)
Abstract:To investigate how film thickness distribution is changed when target etched continously in magnetron sputtering process, a deposition model is found for circular magnetron sputtering target, which is applied in manufacturing. Taylor series expansion is adopted to calculate a third order approximate solution for film thickness distribution. And numerical integration method is applied to calculate film distribution for both new and etched target with different angular distribution of sputtering and target-substrate distance. The calculate results show that sputtering angle has minor effect on film thickness distribution;oppositely, target-substrate distance has great impact on this. With the target substrate distance increases, the differences of film thickness distribution between new and etched target is reduced gradually. To verify this results, a experiment is carried out correspondly, which shows the same results to the calculating ones.
Keywords:magnetron sputtering  film thickness distribution  numerical integration  Taylor′s series
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