A universal de-embedding procedure for the "on-wafer" GHz probing |
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| Authors: | Weng J |
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| Affiliation: | Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore; |
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| Abstract: | A novel de-embedding procedure for "on-wafer" GHz probing is presented. The parasitic effects arising from the bond-pads are modeled generally by two-port networks. Thus, no equivalent circuit details are required. Even the transmission line effects occurring at extremely high frequencies can be taken into account in this model.<> |
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