Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique |
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Authors: | K Rajasree A V Ravikumar P Radhakrishnan V P N Nampoori C P G Vallabhan |
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Affiliation: | 1. Department of Physics, Cochin University of Science and Technology, 682 022, Cochin, India
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Abstract: | Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods. |
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