| 电子仪器失效(故障)分析 |
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| 引用本文： | 万向荣. 电子仪器失效(故障)分析[J]. 电子质量, 2005, 0(9): 31-36 |
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| 作者姓名： | 万向荣 |
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| 作者单位： | 中国电子科技集团公司第41研究所,蚌埠,233006 |
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| 摘 要： | 本文结合具体实例着重介绍了电子测量仪器失效分析中最通用的方法--根据故障部位分析故障产生的原因.为广泛开展失效分析活动,提高电子测量仪器可靠性水平提供重要参考.
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| 关 键 词： | 电子仪器 失效分析 可靠性 |
| 文章编号： | 1003-0107（2005）09-0031-06 |
The Electronic Device Failure(Fault) Analysis |
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| Wan Xiang-rong. The Electronic Device Failure(Fault) Analysis[J]. Electronics Quality, 2005, 0(9): 31-36 |
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| Authors: | Wan Xiang-rong |
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| Abstract: | According to material example, the paper emphasizily introduced the universal method about electronic measuring instruments expiration analysis which according as its parts analysies the reason of the failure .It will be offered importance reference to develop expiration analysis abroadly and improve the reliability of electronic measuring instruments. |
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| Keywords: | Electronics Instrument Failure Analysis Reliability |
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