一种实现数模混合电路中的DAC测试的BIST结构

由于超大规模集成电路技术的快速进步，测试数模混合电路变得越来越困难．针对DAC的测试问题，采用了一种内建自测试（BIST）的测试结构，用模拟加法器把电压测量转换成时间测量的方法，分析并给出了如何利用该结构计算DAC的静态参数．利用该方法，既可以快速得到DAC的静态参数，又提高了测试精度，使得测试电路简单、紧凑和有效．

Built-in-Self-Test Scheme for DAC in Mixed-Signal Circuit

Testing analog/mixed-signal circuitry becomes more and more difficult due to the rapid advance of the VLSI technology. We propose a new built-in self-test (BIST) structure for testing digital-to-analog converter(DAC) by adopting an analog summer to transform the voltage measurement into the timing measurement. Methods and algorithms for calculating DAC's static parameters are discussed. Using the BIST structure, we can calculate the static parameters of DAC's quickly, and improve the accuracy of testing which makes the circuit simple, compact and efficient.