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The total dose effects on the 1/f noise of deep submicron CMOS transistors |
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| Authors: | Hu Rongbin Wang Yuxin Lu Wu |
| Affiliation: | Science and Technology on Analog Integrated Circuit Laboratory, Chongqing 400060, China;Science and Technology on Analog Integrated Circuit Laboratory, Chongqing 400060, China;Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China |
| Abstract: | total dose radiation 1/f noise CMOS |
| Keywords: | total dose radiation 1/f noise CMOS |
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