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Thermal noise in ion-implanted MOSFETs |
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| Authors: | C. Huang A. van der Ziel |
| Affiliation: | Electrical Engineering Department, University of Minnesota, Minneapolis, Minnesota, 55455, USA |
| Abstract: | Measurements are reported on high-frequency noise in ion-implanted MOSFETs. The results are interpreted in terms of the thermal noise of the conducting channel. |
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